A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
نویسندگان
چکیده
In this letter a histogram-based BIST (Built-In Self-Test) approach for deriving the main characteristic parameters of an ADC (Analog to Digital Converter) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method reduces the hardware overhead and testing time while detecting any static faults in an ADC. key words: ADC testing, BIST, histogram testing
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عنوان ژورنال:
- IEICE Transactions
دوره 91-C شماره
صفحات -
تاریخ انتشار 2008